Olympus BX-61 optical microscope with computer controlled stage, autofocus, brightfield, darkfield, Nomarski, etc.
Scanning microwave microscope
Scanning microwave microscope
Scanning electrochemical microscope
Scintag powder diffractometer
Parallel potentiostatic system assembled for testing
Computer controlled resistivity system for automated 4-point probe measurements of thin film libraries (RT-250°C)
