Facilities

The High Speed Circuits and Devices Lab features a range of design, fabrication, and characterization tools to support research in high-speed electronic and optoelectronic devices. A sampling of these capabilities includes:

Vector network analysis to 220 GHz (variable temperature from -60 °C to 200 °C) Wideband vector signal analysis to 26 GHz Spectrum analysis to 330 GHz, spectral response measurements to 1 THz Variable-temperature high-resolution DC current-voltage testing Capacitance-voltage and impedance spectroscopy, 10 Hz to 100 MHz Optical spectral responsivity characterization, wavelengths from 200 nm to 12 µm Microwave noise measurements, 10 MHz to 26 GHz Variable-temperature low-frequency noise measurements (1/f noise) Optoelectronic frequency response measurements to 50 GHz Digital testing to 43 Gb/s Time-domain characterization to 75 GHz; pulse response with 7 ps rise/fall

In addition to the characterization tools in the High Speed Circuits and Devices lab, a full suite of fabrication tools in a cleanroom environment are available in the Notre Dame Nanofabrication Facility.