Facilities
Packaging Equipment
- Teledyne TAC probe station
- Manufacturer:
Teledyne Technologies Inc.
Description
The Teledyne TAC probe station allows testing of devices that are still mounted on a wafer. Each device desired to be tested requires a separate probe card. These probe cards will match the device’s electrical contact pads. A microscope allows visual inspection of the device and alignment of the probe card’s fingers to the electrical contact pads of the device under test.
Allowed Materials
Circuits to be tested that are contained on a semiconductor substrate.
Prohibited Materials
Organics and greases.
Cleaning procedure
Samples should be free of greases, oils, fingerprints, and particles. If necessary, samples should be cleaned in solvents, followed by DI rinse and N2 blow dry. Particular attention should be paid to the back side of the samples.
Contact Information:
For additional information, please contact the NDNF Staff at pfay@nd.edu.
9.04.15
